OP27GS
REV.A
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a
OP27
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.Tel: 781/329-4700www.analog Fax: 781/326-8703© Analog Devices, Inc., 2002
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Low-Noise, Precision Operational Amplifier
PIN CONNECTIONS
TO-99(J-Suffix)
OUT NC = NO CONNECT
FEATURES
Low Noise: 80 nV p-p (0.1 Hz to 10 Hz), 3 nV/√Hz Low Drift: 0.2 ␮V/؇C
High Speed: 2.8 V/␮s Slew Rate, 8 MHz Gain Bandwidth Low V OS : 10 ␮V
Excellent CMRR: 126 dB at V CM  of ±11 V High Open-Loop Gain: 1.8 Million Fits 725, OP07, 5534A Sockets Available in Die Form GENERAL DESCRIPTION
The OP27 precision operational amplifier combines the low offset and drift of the OP07 with both high speed and low noise.Offsets down to 25 µV and drift of 0.6 µV/°C maximum make the OP27 ideal for precision instrumentation applications.Exceptionally low noise, e n  = 3.5 nV/√Hz , at 10 Hz, a low 1/f noise corner frequency of 2.7 Hz, and high gain (1.8 million),allow accurate high-gain amplification of low-level signals. A gain-bandwidth product of 8 MHz and a 2.8 V/µsec slew rate pro
vides excellent dynamic accuracy in high-speed, data-acquisition systems.
A low input bias current of ±10 nA is achieved by use of a bias-current-cancellation circuit. Over the military temperature range, this circuit typically holds I
B  and I OS  to ±20 nA and 15 nA,respectively.
The output stage has good load driving capability. A guaranteed swing of ±10 V into 600 Ω and low output distortion make the OP27 an excellent choice for professional audio applications.
(Continued on page 7)
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*NONINVERTING
INPUT (+)
INVERTING INPUT (–)
Figure 1.Simplified Schematic
8-Pin Hermetic DIP
(Z-Suffix)Epoxy Mini-DIP (P-Suffix)8-Pin SO (S-Suffix)
NC = NO CONNECT
V OS  TRIM –IN +IN V OS  TRIM V+OUT NC
V –
REV. A
–2–OP27ELECTRICAL CHARACTERISTICS          OP27A/E          OP27F
OP27C/G Parameter Symbol Conditions
Min Typ Max
Min Typ Max
Min Typ Max
Unit INPUT OFFSET VOLTAGE 1
V OS 1025206030100µV LONG-TERM V OS STABILITY 2, 3V OS /Time 0.2  1.00.3  1.50.4  2.0µV/M O INPUT OFFSET CURRENT I OS 7359501275 nA INPUT BIAS CURRENT I B ±10
±40±12±55±15±80nA INPUT NOISE VOLTAGE 3, 4e n p-p 0.1 Hz to 10 Hz 0.080.180.080.180.090.25µV p-p INPUT NOISE e n
f O  = 10 Hz    3.5  5.5  3.5  5.5  3.88.0nV/√Hz Voltage Density 3f O = 30 Hz    3.1  4.5  3.1  4.5  3.3  5.6nV/√Hz f O = 1000 Hz    3.0  3.8  3.0  3.8  3.2  4.5
nV/√Hz INPUT NOISE
i n
f O = 10 Hz    1.7  4.0  1.7  4.0  1.7pA/√Hz Current Density 3, 5f O = 30 Hz    1.0  2.3  1.0  2.3  1.0pA/√Hz f O  = 1000 Hz
0.4
0.6
0.4
0.6
0.4
0.6
pA/√Hz
INPUT
RESISTANCE
Differential-Mode 6R IN    1.3
60.94
50.7
4M ΩCommon-Mode R INCM 3
2.5
2G ΩINPUT VOLTAGE RANGE
IVR
±11.0±12.3±11.0±12.3±11.0±12.3V COMMON-MODE
REJECTION RATIO CMRR V CM  = ±11 V 114
126106
123100
120dB
POWER SUPPLY PSRR V S = ±4 V REJECTION RATIO to ±18 V 1
10
1
10
2
20
µV/V LARGE-SIGNAL A VO
R L  ≥ 2 k Ω,VOLTAGE GAIN
V O  = ±10 V 10001800100018007001500V/mV R L  ≥ 600 Ω,V O  = ±10 V 800
1500
800
1500
600
1500
V/mV OUTPUT
VOLTAGE SWING V O R L ≥ 2 k Ω±12.0±13.8±12.0±13.8±11.5±13.5V R L ≥ 600 Ω±10.0±11.5±10.0±11.5±10.0±11.5V SLEW RATE 7SR
R L  ≥ 2 k Ω
1.7
范冰冰 张纪中2.8
1.7
2.8
1.7
2.8
V/µs
GAIN
BANDWIDTH PRODUCT 7GBW    5.08.0  5.08.0  5.08.0MHz
OPEN-LOOP OUTPUT
RESISTANCE R O V O  = 0, I O  = 07070 70ΩPOWER
CONSUMPTION P d
V O
90
140
90
140
100
170
mW
OFFSET
ADJUSTMENT RANGE
R P = 10 k Ω±4.0±4.0±4.0mV
NOTES
1
Input offset voltage measurements are performed ~ 0.5 seconds after application of power. A/E grades guaranteed fully warmed up.2
Long-term input offset voltage stability refers to the average trend line of V OS  versus. Time over extended periods after the first 30 days of operation. Excluding the initial hour of operation, changes in V OS  during the first 30 days are typically 2.5 µV. Refer to typical performance curve.3
Sample tested.4
See test circuit and frequency response curve for 0.1 Hz to 10 Hz tester.5
See test circuit for current noise measurement.6
Guaranteed by input bias current.7
Guaranteed by design.
(@ V S
= ±15 V, T A
= 25؇C, unless otherwise noted.)
–SPECIFICATIONS
OP27 ELECTRICAL CHARACTERISTICS
(@ V S = ±15 V, –55؇C ≤ T A≤ 125؇C, unless otherwise noted.)
OP27A              OP27C
Parameter Symbol Conditions Min Typ Max Min Typ Max Unit INPUT OFFSET
VOLTAGE1V OS306070300µV AVERAGE INPUT
OFFSET DRIFT TCV OS2
TCV OSn30.20.64  1.8µV/°C INPUT OFFSET
CURRENT I OS155030135nA INPUT BIAS
CURRENT I B±20±60±35±150nA INPUT VOLTAGE
RANGE IVR±10.3±11.5±10.2±11.5V COMMON-MODE
REJECTION RATIO CMRR V CM = ±10 V10812294118dB POWER SUPPLY
REJECTION RATIO PSRR V S = ±4.5 V to ±18 V216451µV/V LARGE-SIGNAL
VOLTAGE GAIN A VO R L≥ 2 kΩ, V O = ±10 V6001200300800V/mV OUTPUT
VOLTAGE SWING V O R L≥ 2 kΩ±11.5±13.5±10.5±13.0V
NOTES
1Input offset voltage measurements are performed by automated test equipment approximately 0.5 seconds after application of power. A/E grades guaranteed fully warmed up.
2The TCV
performance is within the specifications unnulled or when nulled with R P = 8 kΩ to 20 kΩ. TCV OS is 100% tested for A/E grades, sample tested for OS
C/F/G grades.
3Guaranteed by design.
REV. A–3–
OP27植树节是几月几日?
ELECTRICAL CHARACTERISTICS(@ V S = ±15 V, –25؇C¯≤ T A≤ 85؇C for OP27J, OP27Z, 0؇C ≤ T A≤ 70؇C for OP27EP,
OP27FP, and –40؇C ≤ T A≤ 85؇C for OP27GP, OP27GS, unless otherwise noted.)
OP27E          OP27F        OP27G
Parameter Symbol Conditions Min Typ Max Min Typ Max Min Typ Max Unit INPUT ONSET
VOLTAGE V OS20504014055220µV AVERAGE INPUT
OFFSET DRIFT TCV OS10.20.60.3  1.30 4  1.8µV/°C TCV OSn20.20.60.3  1.30 4  1.8µV/°C INPUT OFFSET
CURRENT I OS1050148520135nA INPUT BIAS
CURRENT I B±14±60±18±95±25±150nA INPUT VOLTAGE
RANGE IVR±10.5±11.8±10.5±11.8±10.5±11.8V COMMON-MODE
REJECTION RATIO CMRR V CM = ±10 V11012410212196118dB POWER SUPPLY
REJECTION RATIO PSRR V S = ±4.5 V215216232µV/V
to ±18 V
LARGE-SIGNAL
VOLTAGE GAIN A VO R L  ≥ 2 kΩ,
V O = ±10 V750150070013004501000V/mV OUTPUT
VOLTAGE SWING V O R L ≥ 2 kΩ±11.7±13.6±11.4±13.5±11.0±13.3V
NOTES
1The TCV
performance is within the specifications unnulled or when nulled with R P = 8 kΩ to 20 kΩ. TCV OS is 100% tested for A/E grades, sample tested for OS
C/F/G grades.
2Guaranteed by design.
–4–
REV. A
REV. A –5–
OP27
山西太原旅游
OP27N OP27G OP27GR Parameter
Symbol Conditions
Limit Limit Limit Unit INPUT OFFSET VOLTAGE *V OS 3560100µV Max INPUT OFFSET CURRENT I OS 355075nA Max INPUT BIAS CURRENT IB ±40±55±80nA Max INPUT VOLTAGE RANGE IVR ±11±11±11V Min COMMON-MODE REJECTION RATIO
CMRR V CM = IVR 114106100dB Min POWER SUPPLY
PSRR V S = ±4 V to ±18 V 101020µV/V Max LARGE-SIGNAL VOLTAGE GAIN
A VO R L ≥ 2 k Ω, V O = ±10 V 10001000700V/mV Min A VO R L ≥ 600 Ω, V O  = ±10 V 800800600V/mV Min OUTPUT VOLTAGE SWING V O R L ≥ 2 k Ω±12.0±12.0+11.5V Min V O RL2600n ±10.0±10.0±10.0V Min POWER CONSUMPTION
P d
V O  = 0140
140
170
mW Max
NOTE
*Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
WAFER TEST LIMITS
(@ V S  = ±15 V, T A = 25؇C unless otherwise noted.)
DICE CHARACTERISTICS
1.  NULL
2.  (–) INPUT
3.  (+) INPUT
4.  V –
6.  OUTPUT
7.  V+
8.  NULL
DIE SIZE 0.109 ؋ 0.055 INCH, 5995 SQ. MILS
(2.77 ؋ 1.40mm, 3.88 SQ. mm)
OP27
TYPICAL ELECTRICAL CHARACTERISTICS(@ V S = ±15 V, T A = 25؇C unless otherwise noted.)
OP27N OP27G OP27GR
Parameter Symbol Conditions Typical Typical Typical Unit AVERAGE INPUT OFFSET
VOLTAGE DRIFT*TCV OS or Nulled or Unnulled0.20.30.4µV/°C
TCV OSn R P = 8 kΩ to 20 kΩ
AVERAGE INPUT OFFSET
CURRENT DRIFT TCI OS80130180pA/°C AVERAGE INPUT BIAS
CURRENT DRIFT TCI B100160200pA/°C INPUT NOISE VOLTAGE
DENSITY e n f O = 10 Hz  3.5  3.5  3.8nV/√Hz
e n
f O = 30 Hz  3.1  3.1  3.3nV/√Hz
e n
f O = 1000 Hz  3.0  3.0  3.2nV/√Hz INPUT NOISE CURRENT
DENSITY i n f O = 10 Hz  1.7  1.7  1.7pA/√Hz
i n f O = 30 Hz  1.0  1.0  1.0pA/√Hz
i n f O = 1000 Hz0.40.40.4pA/√Hz INPUT NOISE VOLTAGE e np-p0.1 Hz to 10 Hz0.080.080.09µV p-p SLEW RATE SR R L≥ 2 kΩ  2.8  2.8  2.8V/µs
GAIN BANDWIDTH
itunes安装程序PRODUCT GBW888MHz
NOTE
*Input offset voltage measurements are performed by automated test equipment approximately 0.5 seconds after application of power.
–6–
REV. A

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